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Atomic-force microscope Solver PRO-M with measuring cell Smena (NT-MDT, Russia)


 

The scanning atomic force microscope Solver Pro-M (NT-MDT) is intended for the visualization of both conductive and nonconductive nanostructures with spatial resolution up to 0.1 nm. Special measuring techniques allow the investigation of magnetic, conductive, and mechanical properties of samples at the nanoscale.