Equipment

Scanning electron microscope with high resolution Merlin (Carl Zeiss, Germany)

Atomic-force microscope Solver PRO-M with measuring cell Smena (NT-MDT, Russia)

Сonfocal laser scanning luminescent microscope LSM-710 (Karl Zeiss, Germany)

Measuring bench based on spectrometers JASCO J-1500 and CPL-300 for analysis of circular dichroism in absorption and luminescence nanostructures

Chemical laboratory

Scanning electron microscope with high resolution Merlin (Carl Zeiss, Germany)

Atomic-force microscope Solver PRO-M with measuring cell Smena (NT-MDT, Russia)

Сonfocal laser scanning luminescent microscope LSM-710 (Karl Zeiss, Germany)

Measuring bench based on spectrometers JASCO J-1500 and CPL-300 for analysis of circular dichroism in absorption and luminescence nanostructures

Chemical laboratory

Measuring bench based on spectrometers JASCO J-1500 and CPL-300 for analysis of circular dichroism in absorption and luminescence nanostructures

Сonfocal laser scanning luminescent microscope LSM-710 (Karl Zeiss, Germany)

Chemical laboratory

Atomic-force microscope Solver PRO-M with measuring cell Smena (NT-MDT, Russia)

Scanning electron microscope with high resolution Merlin (Carl Zeiss, Germany)

Vacuum deposition setups WATT 450GE-Optic, WATT 450MS, and WATT 450Pch (Ferry Watt company, Russia)

Laser system with tunable wavelength (SOLAR Laser Systems)

Set of semiconductor lasers (TOPTICA, Germany)

Power/energy meter of laser light (Ophir, Israel)

Physical vacuum deposition system PVD 75 (Kurt J. Lesker, USA)

Laser system with tunable wavelength (SOLAR Laser Systems)

Set of semiconductor lasers (TOPTICA, Germany)

Physical vacuum deposition system PVD 75 (Kurt J. Lesker, USA)